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Röntgendiffraktometer


 

Es können folgende Röntgenfeinstruktur-Untersuchungen durchgeführt werden:


Qualitative und Quantitative Phasenanalyse
Identifizieren von unbekannten Substanzen und Bestimmung von Phasenanteilen bei Gemischen.

Kristalluntersuchungen
Bestimmung der Kristallstruktur /-typ, Größe des Kristallgitters, Gitterkonstante, Gitterparameter.

Eigenspannungsmessung
Mechanische Spannungen ohne Einwirkung äußerer Kräfte. Die Spannungsmessung beruht auf der Ermittlung von Gitterdehnungsverteilungen.

Texturbestimmung
Texturen können durch Ziehen und Walzen entstehen. (Anisotropie - gerichtete Anordnung der Kristalle).
Bestimmung der Vorzugsorientierung einzelner Kristalle.


Panalytical X'Pert



Control Unit
PW3040 X'Pert MPD
Generator PW3040(mppc) max. 3 kW, 60 kV, 60 mA.


Goniometer
PW3050/10 (Theta/Theta)
Step size 0,001° in theta oder 2theta




X-Ray-Tube


Cu-LFF-PW3373/00
Normal powder diffraction work.
Phase identification, Quantitative Analysis.
Optimum resolution and high intensity.

Co-LFF-PW3376/00
Normal powder diffraction work on specimens with large amounts of Fe.
Optimum resolution and high intensity.

Cr-LFF-PW3378/00
Stress in steels.
Materials with large unit cells (clay minerals, organic materials, superconductors).
Optimum resolution and high intensity.







Detector


X'Celerator PW3015/20
For fast data collection and high or low intensities.

Xenon Proportional detector PW1711/96
(Xe gas, window diameter: 20 mm).
All applications except those with Mo, W, Ag radiation.




Sample Stage


Open Euleran Cradle (Eulerwiege)
PW3069/00.
(Phi, Psi controlled).
This version is with and without manual Z.


Bracket
PW3072/00 and PW3072/10.
(Phi, Psi controlled).
For PW18xx type sample holders.


MPSS (Multi purpose sample stage)
PW1821/90 and PW3074/00.
For large (<10 cm) and heavy (<1 kg) samples.


Anton Paar HTK-16
High temperature (max. 1600 degr. C.) non-ambient sample stage.
No sample spinning.




Mask, Filter, Slit


Filter
Vanadium, Beta filter for Cr radiation.
Iron, Beta filter for Cr radiation.
Nickel, Beta filter for Cu radiation.

Ni-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Cu radiation.
Fe-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Co radiation.
V-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Cr radiation.


Soller Slit
Soller Slit 0.04 rad.
For all standard applications.


Collimator Cup 0.25.. 4mm
For point focus applications.


Incident Mask Fixed (MPD/MRD)
Mask fixed 5, 10, 15, 20 mm


Divergence Slit, Receiving Slit, Anti-Scatter Slit
Slit fixed, 4°, 2°, 1°, 1/2°, 1/4°, 1/8°, 1/16°, 1/32°

Can be used as Divergence Slit, Receiving Slit and Anti-scatter Slit and incident Anti-scatter Slit for PSD.


Receiving Slit - Parallplate Collimator Slit
For reflectivity analysis. Aperture is 0.1 mm.


Collimator
For low resolution phase analysis on thin film samples and samples with rough surfaces and reflectivity analysis.
Coll. 0.27° (Thin film)


Beam Attentuator
For mirror with Cu radiation.
Enables large dynamic range. Cu 0.02 mm