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Katalog plus

Transmission Electron Microscope

Technical specifications:

•Acceleration voltage: 200kV

• Field emission cathode
•1,8e9 A/cm2; Vergleich : 4e8 A/cm2
•Beampower: 1,5 pA;
•Resolution
•TEM-Dotresolution: 0,25 nm
•STEM HAADF: 0,16 nm
•EDX: 0,9nm
•Diffraction
•Lenght of camera: 12-5100mm
•Diffractionangle: +-12
•Image and  Video (fps=frames per second)
•16 MP CMOS für image arquisition
•4k x 4k: 1fps
•512 x 512: 25fps
•Livecamera with 40 fps for manual searching
•Samplebracket
•Tiltbracket for EDS
•Double-tilt-bracket for EDS, strong version
•Tilt angle for both axes +-30°
•For magnetic samples(z.B. DSS)
•Double-tilt-bracket for EDS
•Tilt angle for both axes: +-30°
•Optimized for highest resolution and EDS
•Liquid-nitrogen-cooled double-tilt-bracket for EDS
 talos-f200x

•EDS
•Measurement time for datadot:
•t<10μs/dot à 1e6 dots/s
•105 spectra/s
•Controling software and computer •10x Analysis software for installing on diffenrent computers

•Tomographic package 
•Tiltangle +-75°
•Controllingsoftware for semiautomatic measurements 
•Software for viewing it on different computers

•Other
•Cooling trap with 4-day-reservoir

• Piezocontrol of the  sample position : 20pm steps

 

 

 

Aktualisiert via XIMS am 30.5.2016 von W. Kramer