| Following X-Ray-Examinations can be performed:
Qualitative and quantitative phase analysis: Identification of unknown substances and determination of phase fractions in mixtures.
Crystal investigations: Determination of the crystal structure / type, size of the crystal lattice, lattice constant, lattice parameters. Residual stress measurement: Mechanical stresses without any external forces. The voltage measurement is based on the determination of lattice strain distributions. Texture determination: Textures can be caused by drawing and rolling. (Anisotropy - directional arrangement of the crystals). Determination of the preferred orientation of single crystals.
Panalytical X'Pert |
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| Control Unit
PW3040 X'Pert MPD
Generator PW3040(mppc) max. 3 kW, 60 kV, 60 mA. |  |
| Goniometer
PW3050/10 (Theta/Theta)
Step size 0,001° in theta oder 2theta |  |
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| X-Ray-Tube |
| Cu-LFF-PW3373/00
Normal powder diffraction work.
Phase identification, Quantitative Analysis.
Optimum resolution and high intensity.
Co-LFF-PW3376/00
Normal powder diffraction work on specimens with large amounts of Fe.
Optimum resolution and high intensity.
Cr-LFF-PW3378/00
Stress in steels.
Materials with large unit cells (clay minerals, organic materials, superconductors).
Optimum resolution and high intensity. | 
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| Detector |
| X'Celerator PW3015/20
For fast data collection and high or low intensities.
Xenon Proportional detector PW1711/96
(Xe gas, window diameter: 20 mm).
All applications except those with Mo, W, Ag radiation. |  |
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| Sample Stage |
| Open Euleran Cradle (Eulerwiege)
PW3069/00.
(Phi, Psi controlled).
This version is with and without manual Z. |  |
| Bracket
PW3072/00 and PW3072/10.
(Phi, Psi controlled).
For PW18xx type sample holders. |  |
| MPSS (Multi purpose sample stage)
PW1821/90 and PW3074/00.
For large (<10 cm) and heavy (<1 kg) samples. |  |
| Anton Paar HTK-16
High temperature (max. 1600 degr. C.) non-ambient sample stage.
No sample spinning. |  |
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| Mask, Filter, Slit |
| Filter
Vanadium, Beta filter for Cr radiation.
Iron, Beta filter for Cr radiation.
Nickel, Beta filter for Cu radiation.
Ni-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Cu radiation.
Fe-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Co radiation.
V-0.02 mm (PSD) Beta filter for the Raytech/Braun PSD with Cr radiation. |  |
| Soller Slit
Soller Slit 0.04 rad.
For all standard applications. |  |
| Collimator Cup 0.25.. 4mm
For point focus applications. |  |
| Incident Mask Fixed (MPD/MRD)
Mask fixed 5, 10, 15, 20 mm |  |
| Divergence Slit, Receiving Slit, Anti-Scatter Slit
Slit fixed, 4°, 2°, 1°, 1/2°, 1/4°, 1/8°, 1/16°, 1/32°
Can be used as Divergence Slit, Receiving Slit and Anti-scatter Slit and incident Anti-scatter Slit for PSD. |  |
| Receiving Slit - Parallplate Collimator Slit
For reflectivity analysis. Aperture is 0.1 mm. |  |
| Collimator
For low resolution phase analysis on thin film samples and samples with rough surfaces and reflectivity analysis.
Coll. 0.27° (Thin film) |  |
| Beam Attentuator
For mirror with Cu radiation.
Enables large dynamic range. Cu 0.02 mm |  |
